Low-quality Patents in the Eye of the Beholder: Evidence from Multiple Examiners
NBER Working Paper No. 22244
---- Acknowledgments ----
The authors are grateful to seminar and conference participants at the New Zealand Economic Association Conference, Asia Pacific Innovation Conference, European Intellectual Property Policy Conference, Toulouse School of Economics, ETH Zurich, and the third International Meeting in Law & Economics (Paris) for valuable feedback. Joachim Henkel and Sonia Jaffe provided valuable comments. T’Mir Julius provided excellent research assistance and her contribution is gratefully acknowledged. This study was financed by the Australian Research Council Discovery Grant ARC LP110100266 “The Efficiency of the Global Patent System” with partners IP Australia and the Institute of Patent and Trademark Attorneys. The views expressed herein are those of the authors and do not necessarily reflect the views of the National Bureau of Economic Research.