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  • Kyle W. Higham, Gaétan de Rassenfosse, and Adam B. Jaffe, "Patent Quality: Towards a Systematic Framework for Analysis and Measurement," NBER Working Paper 27598 (2020), https://doi.org/10.3386/w27598.

Published Versions

Higham, Kyle & de Rassenfosse, Gaétan & Jaffe, Adam B., 2021. "Patent Quality: Towards a Systematic Framework for Analysis and Measurement," Research Policy, Elsevier, vol. 50(4). citation courtesy of

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