An Empirical Examination of Patent Hold-up
NBER Working Paper No. 21090
---- Acknowledgments ----
We thank Joanna Tsai and Victor Menaldo for comments and Ian Claras, Adriane Fresh, and Benjamin Levine for their excellent research assistance. Research support was provided by the Working Group on Intellectual Property, Innovation, and Prosperity (IP2) of the Hoover Institution at Stanford University. The views expressed herein are those of the authors and do not necessarily reflect the views of the National Bureau of Economic Research.