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  • Iain M. Cockburn, Samuel Kortum, and Scott Stern, "Are All Patent Examiners Equal? The Impact of Examiner Characteristics," NBER Working Paper 8980 (2002), https://doi.org/10.3386/w8980.

Published Versions

Cohen, Wesley and Steven Merrill (eds.) Patents in the Knowledge-Based Economy. National Academies Press, 2003.

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